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Technology: Diffusing Wave Spectroscopy


DWS measures the fluctuation of the light intensity scattered by the sample. Light fluctuates because of the mobility of the particles (Brownian motion).

Interfering Backscattering wave generated by the motion of the particles leads to a speckle pattern formation on the multipixels detector.

Speckle image generated on the Multipixel detectors is treated to plot the decorrelation curve which quantifies the particle motion speed

Decorrelation curve enables to plot the particle Mean Square Displacement (MSD) which quantify the displacement in nanometer of the particles

MSD curve enables to calculate the microrheology Viscous and Elastic moduli (G’’µR , G’µR) using the Generalized Stokes-Einstein Relation (GSER)


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